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Home > Archives > Volume 20, No 8 (2022) > Article

DOI: 10.14704/nq.2022.20.8.NQ44530

PREPARATION AND CHARACTERIZATION ON ZIRCONIUM NANOMATERIAL THIN FILMS

A.Thenmozhi, S.Lekasri, R.Srilaxmi, R.K.Sangeetha

Abstract

When compared to other deposition techniques, the chemical bath deposition process has various benefits. Numerous researchers have emphasized how easy, affordable, and practical this deposition method is for large-area deposition at low temperatures. In this report, Zirconium Sulphide (ZrS2) doped with Antimony thin films were deposited using chemical Bath deposition method. The prepared films were characterized by X-ray Diffraction analysis (XRD), Optical, FTIR, Photoluminescence and Electrical studies were carried out and the results were reported.

Keywords

Thinfilms, Zirconium Sulphide, Xrd, Optical, FTIR, PL

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