DOI: 10.14704/nq.2022.20.8.NQ44530
PREPARATION AND CHARACTERIZATION ON ZIRCONIUM NANOMATERIAL THIN FILMS
A.Thenmozhi, S.Lekasri, R.Srilaxmi, R.K.Sangeetha
Abstract
When compared to other deposition techniques, the chemical bath deposition process has various
benefits. Numerous researchers have emphasized how easy, affordable, and practical this deposition
method is for large-area deposition at low temperatures. In this report, Zirconium Sulphide (ZrS2) doped
with Antimony thin films were deposited using chemical Bath deposition method. The prepared films were characterized by X-ray Diffraction analysis (XRD), Optical, FTIR, Photoluminescence and Electrical studies were carried out and the results were reported.
Keywords
Thinfilms, Zirconium Sulphide, Xrd, Optical, FTIR, PL
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